Tensile specimen measuring apparatus and method
US7644629B2 · kind B2 · utility
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2References
20Claims
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Assignee
Inventors
Key dates
| Filing date | Feb 12, 2008 |
| Grant date | Jan 12, 2010 |
| Priority date | — |
| Expiry date | Apr 22, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2203/0017
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A tensile specimen measuring apparatus includes a generally elongated base, a generally elongated pin channel provided in the base, a measuring pin carrier slidably mounted in the pin channel of the base, at least one contact pin carried by the measuring pin carrier, at least one contact pin disposed at an end of the pin channel of the base in generally spaced-apart relationship with respect to the at least one contact pin carried by the measuring pin carrier and an electronic measuring device engaging the at least one contact pin carried by the measuring pin carrier. A tensile specimen measuring method is also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.