Reflectance measuring apparatus
US7646487B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 11, 2008 |
| Grant date | Jan 12, 2010 |
| Priority date | — |
| Expiry date | Apr 11, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/55
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A reflectance measuring apparatus is provided in the present invention. In addition to measuring the intensity of light directly reflected from a sample, the apparatus is further capable of collecting large-angle reflected light scattered from the sample through a reflecting cover disposed over the sample and measuring the intensity thereof. In one embodiment, the reflecting cover has a parabolic surface for modulating the large-angle reflected light to become parallel light projecting onto a photo-detector. In another embodiment, the reflecting cover has an elliptic surface for modulating the large-angle scattered light to focus on the photo-detector.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.