Scanning probe with constant scanning speed
US7647706B2 · kind B2 · utility
13Cited by
6References
12Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 21, 2008 |
| Grant date | Jan 19, 2010 |
| Priority date | — |
| Expiry date | Apr 1, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B21/045
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for scanning a surface of a workpiece 1 at a constant scanning speed /va/ using a scanning probe 2 mounted on a support 3 on a coordinate measuring machine (CMM) 4. The CMM contains a first set of drive means (6, 7, 8) to move the support according to three linear axis (x,y,z), and the support 3 contains a second set of drive means (14, 17) for actuating the movement of the scanning probe 2 with two degrees of freedom relative to said support 3. The method involves control means 33 coupled to the sets of drive means (6, 14, 17), and memory means for storing theoretical profiles and coordinates of the surface to scan.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.