Systems and methods for temperature measurement using n-factor coefficient correction
US7648271B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 23, 2007 |
| Grant date | Jan 19, 2010 |
| Priority date | — |
| Expiry date | Jan 16, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01K2219/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Various systems and methods for temperature measurement are disclosed. For example, some embodiments of the present invention provide temperature measurement systems. Such temperature measurement systems include a variable current source and a diode connected transistor. The variable current source is capable of applying two or more distinct currents to the diode connected transistor. The currents result in a different base-emitter voltage on the diode connected transistor. The systems further include an n-factor coefficient register and an analog to digital converter. The analog to digital converter is operable to receive two of the base-emitter voltages created by applying the different currents, and to provide a digital output based at least in part on a value stored in the n-factor coefficient register and the two base-emitter voltages.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.