Temperature control in an integrated circuit
US7649374B2 · kind B2 · utility
4Cited by
3References
15Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Sep 1, 2006 |
| Grant date | Jan 19, 2010 |
| Priority date | — |
| Expiry date | Jun 19, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/3171
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
One example of a test board includes first and second communication ports configured for communication with a master device and a DUT, respectively. A bit error rate tester of the test board is arranged for communication with the master device and with the DUT by way of the first and second communication ports, respectively, and the bit error rate tester includes at least one IC whose maximum data rate is temperature sensitive. Finally, the test board includes a temperature control system arranged to control the IC temperature so that a maximum data rate of the IC can be adjusted through the use of thermal effects.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.