Method for locating an impact on a surface and device for implementing such a method
US7649807B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 10, 2005 |
| Grant date | Jan 19, 2010 |
| Priority date | — |
| Expiry date | Sep 2, 2025 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F3/0436
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Method for locating an impact on a surface (9), in which acoustic sensors (6) pick up acoustic signals ski (t) generated by the impact and the impact is located by calculating, for a number of reference points of index j, a validation parameter representative of a function: PRODkji1i2. . . i2P(ω)=φSki1(ω) φRji1(ω)*φSki2(ω)*φRji2(ω) . . . φSki2p(ω)*φRji2p(ω) where: φSki(ω) and φRji(ω)* are complex phases of Ski(ω) and of Rji(ω), for i=i1, i2, . . . , i2p, indices denoting sensors, Ski(ω) and Rji(ω) being the Fourier transform of ski(t) and rji(t), rji(t) being a reference signal corresponding to the sensor i for an impact at the reference point j, p being a non-zero integer no greater than NSENS/2.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.