Apparatus and method for detecting defect signals
US7649820B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 27, 2005 |
| Grant date | Jan 19, 2010 |
| Priority date | — |
| Expiry date | Nov 24, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B20/1816
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
The method of detecting defect signals includes: setting a default pit length range; inputting a data signal including a plurality of pits with different pit lengths; transferring the data signal into NRZ signal and counting the pit length of each pit; accumulating the number of the pits whose pit length are within the default pit length range, and accumulating the number of the pits whose pit lengths are outside the default pit length range but within the corresponding ranges; changing the logic state of a defect flag signal when one of the accumulative value reaches a corresponding threshold. The present invention also provides an apparatus for detecting defect signals.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.