Apparatus and method for z-location dependent x-ray beam filtration for imaging system
US7649973B1 · kind B1 · utility
6Cited by
4References
20Claims
0Family size
Assignee
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Key dates
| Filing date | Oct 2, 2008 |
| Grant date | Jan 19, 2010 |
| Priority date | — |
| Expiry date | Oct 2, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/313
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An imaging system includes at least two x-ray sources, an x-ray detector assembly and an attenuation filter. The at least two x-ray sources are displaced along a z-axis and configured to alternately emit x-ray beams. The x-ray detector assembly is configured to detect the x-ray beams. The attenuation filter is mounted proximate the at least two x-ray sources and is configured to provide different amounts of x-ray attenuation to the x-ray beams along the z-axis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.