System and method for determining dimensions of structures/systems for designing modifications to the structures/systems
US7649976B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 10, 2006 |
| Grant date | Jan 19, 2010 |
| Priority date | — |
| Expiry date | Feb 10, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/203
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system of determining the physical dimensions and configuration of a structure or system as a precursor to the design of modifications of the structure or system by analyzing hidden objects within the structure or system is provided. The method includes accessing the structure or system prior to the modification for preparation of the modification; scanning the structure or system with an x-ray backscatter unit; collecting data from the x-ray backscatter unit and combining and reconstructing the data into a 2-D, 2-D panoramic or 3-D data set; producing surfaces and structures of the hidden objects from the data set; and tying the surfaces and structures of the hidden objects into a pre-existing coordinate system of the structure or system creating a 3-D model.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.