Contour measuring probe
US7650701B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Dec 28, 2007 |
| Grant date | Jan 26, 2010 |
| Priority date | — |
| Expiry date | Feb 24, 2028 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S33/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An exemplary contour measuring probe (10) includes a tube guide (12), a tip extension (20), a pair of hollow tubes (16), a plurality of pipes (104, 106), a linear measuring scale (18), and a displacement sensor (19). The tip extension (20) is configured to touch a surface of an object (50). The hollow tubes (16) are configured to be driven by a flux of air to push the tip extension (20) to move. The pipes (104, 106) are obliquely disposed in a tube guide (12) relative to the hollow tubes (16). The pipes (104, 106) allow the flux of air to be pumped on a sidewall of the hollow tubes (16). A part of the flux of air is ejected out of the tube guide (12). The linear measuring scale (18) and the displacement sensor (19) are respectively fixed relative to one of the tube guide (12) and the tip extension (20). The linear measuring scale (18) displays values of displacements of the tip extension (20). The displacement sensor (19) detects and reads the displacement values displayed by the linear measuring scale (18).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.