Method of determining alignment of images in high dimensional feature space
US7653264B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 3, 2006 |
| Grant date | Jan 26, 2010 |
| Priority date | — |
| Expiry date | Jul 4, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/764
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method determines alignment of images in high dimensional feature space. The method comprises registering a source image of a reference modality to a target image of a second modality with an algorithm based upon a measure of information affinity present in both of the source and target image to create a registered image. Next, a plurality of feature vector are extracted from the registered image for each of the source and target images and attributes of the joint distribution of feature vector are captured using an entropic graph spanning the features. Edge lengths are between proximal feature vectors are extracted from the entropic graph and a similarity measure of one of an α-divergence estimate or an α-affinity estimate is constructed based upon these edge lengths to quantify whether the source and target image are sufficiently registered.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.