Systems and methods for measuring the useful life of solid-state storage devices
US7653778B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 8, 2006 |
| Grant date | Jan 26, 2010 |
| Priority date | — |
| Expiry date | Oct 28, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2212/7211
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A non-volatile solid-state storage subsystem, such as a non-volatile memory device, maintains usage statistics reflective of the wear state, and thus the remaining useful life, of the subsystem's memory array. A host system reads the usage statistics information, or data derived therefrom, from the subsystem to evaluate the subsystem's remaining life expectancy. The host system may use this information for various purposes, such as to (a) display or report information regarding the remaining life of the subsystem; (b) adjust the frequency with which data is written to the subsystem; and/or (c) select the type(s) of data written to the subsystem.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.