Method and apparatus for generating a characteristics model for a pattern-based system design analysis using a schema
US7653898B1 · kind B1 · utility
14Cited by
7References
19Claims
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Key dates
| Filing date | May 20, 2005 |
| Grant date | Jan 26, 2010 |
| Priority date | — |
| Expiry date | Feb 6, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/2247
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method for analyzing a target system that includes generating a characteristics model using a schema defining a domain, obtaining a plurality of characteristics from the target system using a characteristics extractor, wherein the plurality of characteristics is associated with the characteristics model storing each of the plurality of characteristics in a characteristics store, and analyzing the target system by issuing at least one query to the characteristics store to obtain an analysis result.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.