Contour measuring method for measuring aspects of objects
US7654008B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Dec 28, 2007 |
| Grant date | Feb 2, 2010 |
| Priority date | — |
| Expiry date | Jul 24, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B5/012
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An exemplary contour measuring method for measuring aspects of objects includes: (1) providing a contour measuring probe (10) comprising a tip extension (16), a displacement sensor (19), and a processor (119) connected to the displacement sensor, the tip extension being slidable in a first direction; (2) driving the tip extension to move so as to contact with the object at a first predetermined point, and recording a coordinate of the first predetermined point in the processor; (3) driving one of the tip extension and the object to move, thus, the tip extension contacting with the object at a second predetermined point, the displacement sensor sensing a displacement of the tip extension along the first direction and sending the displacement to the processor, and the processor recording a coordinate of the second predetermined point; and (4) repeating the step (3), the processor recording a series of measured coordinates of points.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.