Patent · US Expired

Methods for prenatal diagnosis of chromosomal abnormalities

US7655399B2 · kind B2 · utility

138Cited by
12References
13Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 8, 2004
Grant dateFeb 2, 2010
Priority date
Expiry dateOct 8, 2024

Classification

  • Technology area (CPC C)Chemistry; Metallurgy
  • CPC primaryC12Q2600/166
  • WIPO fieldBiotechnology
  • WIPO sectorChemistry

Abstract

Chromosomal abnormalities are responsible for a significant number of birth defects, including mental retardation. The present invention is related to methods for non-invasive and rapid, prenatal diagnosis of chromosomal abnormalities based on analysis of a maternal blood sample. The invention exploits the differences in DNA between the mother and fetus, for instance differences in their methylation states, as a means to enrich for fetal DNA in maternal plasma sample. The methods described herein can be used to detect chromosomal DNA deletions and duplications. In a preferred embodiment, the methods are used to diagnose chromosomal aneuploidy and related disorders, such as Down's and Turner's Syndrome.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.