Calibrating a defect scan parameter for a disk drive
US7656763B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 4, 2007 |
| Grant date | Feb 2, 2010 |
| Priority date | — |
| Expiry date | Jul 17, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11B5/09
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A method is disclosed for performing a defect scan for a disk drive. Data is recorded on a first data area of a disk substantially free from defects and on a second data area of the disk substantially affected by at least one defect. A defect scan parameter is initialized with an initial setting. The first data area is read to determine a first defect threshold, and the second data area is read to determine a second defect threshold. A margin is saved representing a difference between the first and second defect thresholds. The setting for the defect scan parameter is adjusted, and the elements of reading the first and second data areas and saving a corresponding margin are repeated at least once. A setting is then selected for the defect scan parameter in response to the saved margins.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.