Patent · US Expired

Device and method for mapping the distribution of an X-ray fluorescence marker

US7656996B2 · kind B2 · utility

2Cited by

2References

10Claims

0Family size

Assignee

KONINKLIJKE PHILIPS ELECTRONICS NV · NL

Inventors

Geoffrey Harding · Hamburg, DE
Gerhard Martens · Henstedt-Ulzburg, DE
Hans Barschdorf · Dassendorf, DE
Bernd Schweizer · Herzogenrath, DE

Key dates

Filing date	Feb 11, 2005
Grant date	Feb 2, 2010
Priority date	—
Expiry date	Jul 26, 2025

Classification

Technology area (CPC G)Physics
CPC primaryG01N2223/0766
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The invention relates to a method and a device for determining the distribution of an X-ray fluorescence (XRF) marker (16) in a body volume (14). The body volume (14) is irradiated with a beam of rays (12) from an X-ray source (10) with a first ray component with a quantum energy just above and a second ray component with a quantum energy just below the K-edge of the XRF marker (16). Secondary radiation emitted from the body volume (14) is detected in a location-resolved way by a detector (30). To separate the X-ray fluorescence components in the secondary radiation from background radiation, the body volume is irradiated for a second time with a beam of rays from which the first ray component has been substantially removed by a filter (22) made from the material of the XRF marker.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.