Patent · US Expired

Method of and apparatus for displaying structure optimizing result

US7657412B2 · kind B2 · utility

3Cited by
13References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 22, 2002
Grant dateFeb 2, 2010
Priority date
Expiry dateNov 6, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F2111/06
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

To provide a method of and an apparatus for displaying a structure optimizing result which are capable of displaying rigidity values calculated on the basis of an initial wall thickness value, an optimum wall thickness value, and a standard wall thickness value in such a manner that a change between two of these rigidity values is clearly indicated. The structure optimizing result is displayed wherein an actual rigidity value of a structure is calculated on the basis of an inputted initial value of a wall thickness of each component of the structure. An optimum value of the wall thickness of each of the components is calculated on the basis of a sensitivity analysis result in order to make the calculated actual rigidity value close to a required rigidity value of the structure and the calculated result is displayed. In the method and apparatus, the actual rigidity value and a rigidity value of the structure on the basis of the optimum wall thickness value of each of the component are comparatively displayed as a list by an output calculation/display control unit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.