Method and apparatus for testing a dual mode interface
US7657799B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 4, 2006 |
| Grant date | Feb 2, 2010 |
| Priority date | — |
| Expiry date | Jan 23, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/221
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed is a system and method for testing a dual mode interface. The dual mode interface includes a first strobe circuit and a second strobe circuit configured to be inoperable during a first operational mode of the interface and operable during a second operational mode of the interface. The dual mode interface also includes a first data circuit and a second data circuit configured to be operable during the first operational mode and the second operational mode. The dual mode interface also includes a signal line connecting an output of the second strobe circuit with an input of the first strobe circuit and a switch element configured to activate said signal line in response to receipt of a test signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.