Patent · US Expired

Method and apparatus for generating components for pattern-based system design analysis using a characteristics model

US7660802B2 · kind B2 · utility

0Cited by
16References
13Claims
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Key dates

Filing dateMay 20, 2005
Grant dateFeb 9, 2010
Priority date
Expiry dateJan 16, 2026

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F8/75
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method for analyzing a target system that includes obtaining a characteristics model, generating at least one selected from the group consisting of a schema, characteristics store API, and a characteristics extractor, using the characteristics model, obtaining a plurality of characteristics from the target system using characteristics extractor, wherein each of the plurality of characteristics is associated with the characteristics model, storing each of the plurality of characteristics in the characteristics store using the schema, and analyzing the target system by issuing at least one query to the characteristics store to obtain an analysis result.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.