Method and system for defect investigation of component
US7661314B2 · kind B2 · utility
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3References
5Claims
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Assignee
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Key dates
| Filing date | Oct 2, 2006 |
| Grant date | Feb 16, 2010 |
| Priority date | — |
| Expiry date | Apr 18, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/101
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
One surface of a component is obliquely ensonified through a liquid or gaseous first medium with a checking sound beam produced by a transmission/reception transducer for defect investigation of the component. A response sound beam, which is reflected back from the surface to the transmission/reception transducer, is received and its delay time in the medium between the transmission/reception transducer and the surface is evaluated. The delay time in the medium determined in this way is taken into account for localization of a defect within the component.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.