Patent · US Expired

Self-assembled interconnection particles

US7662708B2 · kind B2 · utility

6Cited by
17References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 27, 2005
Grant dateFeb 16, 2010
Priority date
Expiry dateJul 27, 2025

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH05K2203/122
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of forming a self-assembled interconnect structure is described. In the method, a contact pad surface and particles in a solution are brought together. The particles are selected such that they the particles adhere to the contact pad surface. Formation of a contact is completed by pressing an opposite contact into the particles such that an electrical connection is formed via the particles between the opposite contact pad and the substrate surface contact pad. The described self-assembled interconnect structure is particularly useful in display device fabrication.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.