Method and device for classifying cells in a layout into a same environment and their use for checking the layout of an electronic circuit
US7665051B2 · kind B2 · utility
192Cited by
3References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 1, 2007 |
| Grant date | Feb 16, 2010 |
| Priority date | — |
| Expiry date | Feb 12, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F30/398
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and a device can be used for checking the layout of an electronic circuit of a semiconductor component. For example, the method includes an automatic classification of cells in at least one layout into a cell database, and an automatic layout checker comparing the cell database to a layout to be checked.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.