Patent · US Active

Methods of forming wiring to transistor and related transistor

US7666723B2 · kind B2 · utility

258Cited by
2References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 22, 2007
Grant dateFeb 23, 2010
Priority date
Expiry dateApr 26, 2028

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

Methods of wiring to a transistor and a related transistor are disclosed. In one embodiment, the method includes a method of forming wiring to a transistor, the method comprising: forming a transistor on a semiconductor-on-insulator (SOI) substrate using masks that are mirror images of an intended layout, the forming including forming a gate and a source/drain region for each and a channel, the SOI substrate including a semiconductor-on-insulator (SOI) layer, a buried insulator layer and a silicon substrate; forming a dielectric layer over the transistor; bonding the dielectric layer to another substrate; removing the silicon substrate from the SOI substrate to the buried insulator layer; forming a contact to each of the source/drain region and the gate from a channel side of the gate; and forming at least one wiring to the contacts on the channel side of the gate.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.