Built-in self test for a CMOS imager
US7667751B2 · kind B2 · utility
4Cited by
43References
16Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 8, 2003 |
| Grant date | Feb 23, 2010 |
| Priority date | — |
| Expiry date | Jul 24, 2026 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N25/633
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Systems, methods and devices related to detection and transmitting images. Imaging systems and devices, as well as methods of using such that are provided herein include flicker detection and/or correction; and/or built-in self test associated with various analog circuitry in the imaging devices; and/or power reduction ability; and/or pixels with charge evacuation functionality; and/or a parallel to serial conversion unit and associated serial output interface; and/or other advanced functionality.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.