Stain inspection method and apparatus
US7668344B2 · kind B2 · utility
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3References
33Claims
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Key dates
| Filing date | Feb 9, 2006 |
| Grant date | Feb 23, 2010 |
| Priority date | — |
| Expiry date | Apr 7, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30148
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
(A) Luminance data is prepared. (B) A group of first order differential values is obtained from luminance values of said luminance data along a first direction, a group of second order differential values is obtained from the group of first order differential values, and first data is output in accordance with the group of second order differential values. There is provided a stain inspection method having high inspection correctness.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.