Shape feature extraction and classification

US7668376B2 · kind B2 · utility

Assignee

• National Instruments Corporation · US

Inventors

• Siming Lin · Austin, US
• Kevin M. Crotty · Austin, US
• Nicolas Vazquez · Austin, US

Key dates

• Filing date: Dec 3, 2004
• Grant date: Feb 23, 2010
• Expiry date: Feb 7, 2027

Classification

• Technology area (CPC G): Physics
• CPC primary: G06V10/809
• WIPO field: Computer technology
• WIPO sector: Electrical engineering

Abstract

System and method for analyzing an image. A received image, comprising an object or objects, is optionally preprocessed. Invariant shape features of the object(s) are extracted using a generalized invariant feature descriptor. The generalized invariant feature descriptor may comprise a generalized invariant feature vector comprising components corresponding to attributes of each object, e.g., related to circularity, elongation, perimeter-ratio-based convexity, area-ratio-based convexity, hole-perimeter-ratio, hole-area-ratio, and/or functions of Hu Moment 1 and/or Hu Moment 2. Non-invariant features, e.g., scale and reflection, may be extracted to form corresponding feature vectors. The object is classified by computing differences between the generalized invariant feature vector (and optionally, non-invariant feature vectors) and respective generalized invariant feature vectors corresponding to reference objects, determining a minimum difference corresponding to a closest reference object or class of reference objects of the plurality of reference objects, and outputting an indication of the closest reference object or class as the classification.