Large signal scattering functions from orthogonal phase measurements
US7671605B2 · kind B2 · utility
5Cited by
10References
12Claims
0Family size
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Key dates
| Filing date | Jan 17, 2008 |
| Grant date | Mar 2, 2010 |
| Priority date | — |
| Expiry date | Aug 22, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/32
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention measures the X-parameters (or large-signal S and T scattering functions, sometimes called linearized scattering functions, which are the correct way to define “large-signal S-parameters”) with only two distinct phases for small-signals on a frequency grid established by intermodulation frequencies and harmonics of the large-tones, with guaranteed well-conditioned data from which the X-parameter functions can be solved explicitly, without the need for regression, and not limited by performance limits of the reference generator or phase-noise.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.