Patent · US Expired

Method and apparatus for an advanced optical analyzer

US7671983B2 · kind B2 · utility

47Cited by
19References
34Claims
0Family size

Assignee

Inventors

Key dates

Filing dateApr 30, 2004
Grant dateMar 2, 2010
Priority date
Expiry dateJun 23, 2025

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2021/651
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The present invention provides a sample tank having a window for introduction of electromagnetic energy into the sample tank for analyzing a formation fluid sample down hole or at the surface without disturbing the sample. Near infrared, mid infrared and visible light analysis is performed on the sample to provide a downhole in situ or surface on site analysis of sample properties and contamination level. The onsite analysis comprises determination of gas oil ratio, API gravity and various other parameters which can be estimated by a trained neural network or chemometric equation. A flexural mechanical resonator is also provided to measure fluid density and viscosity from which additional parameters can be estimated by a trained neural network or chemometric equation. The sample tank is pressurized to obviate adverse pressure drop or other effects of diverting a small sample.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.