Device and method for testing electronic components

US7673520B2 · kind B2 · utility

Assignee

• RASCO GMBH · DE

Inventors

• Alfred Langer · Kolbermoor, DE
• Christian Hellmuth · Stephanskirchen, DE

Key dates

• Filing date: Mar 7, 2007
• Grant date: Mar 9, 2010
• Expiry date: May 26, 2027

Classification

• Technology area (CPC G): Physics
• CPC primary: G01R31/2893
• WIPO field: Measurement
• WIPO sector: Instruments

Abstract

The invention relates to a device for testing electronic components (3) with at least two mechanical transfer elements (5a, 5b), of which each can be loaded in each case at a dedicated loading position with an electronic component (3) and with a common test position (7), into which the two transfer elements (5a, 5b) can be brought. Furthermore, the invention relates to a device for testing electronic components with at least two mechanical transfer elements (80a, 80b), of which each can be loaded in each case at a common loading position (88) with an electronic component (3) and with a common test position (89), into which the two transfer elements (80a, 80b) can be brought. The invention also relates to the associated method.