Defective imaging element compensation
US7673958B2 · kind B2 · utility
8Cited by
9References
28Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 21, 2005 |
| Grant date | Mar 9, 2010 |
| Priority date | — |
| Expiry date | Oct 17, 2028 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB41J2/2139
- WIPO fieldTextile and paper machines
- WIPO sectorMechanical engineering
Abstract
A method for forming an image with at least one linear array of imaging elements. Defective ones of the imaging elements associated with a particular color are detected. A first defective imaging element compensation operation is performed for portions of the image data that are associated with a first predetermined number or fewer adjacent defective imaging elements. A different second defective imaging element compensation operation is performed for portions of the image data that are associated a second predetermined number or more adjacent defective imaging elements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.