Sensor scan planner
US7676064B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 17, 2006 |
| Grant date | Mar 9, 2010 |
| Priority date | — |
| Expiry date | Dec 9, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06Q10/04
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Sensor scan planner methods and systems are described. In an embodiment, a sensor scan schedule can be generated by a sensor scan schedule generator to optimize the scan schedules of multiple sensors based on optimal capabilities of each sensor and autonomous target recognition algorithm processing. A search manager can then assign an evaluation criteria value to the generated sensor scan schedule based on sensor scan schedule evaluation criteria, and compare the evaluation criteria value to other evaluation criteria values corresponding to respective previously generated sensor scan schedules to determine an optimal sensor scan schedule. The search manager can then determine whether to generate additional sensor scan schedules and assign additional evaluation criteria values for comparison to determine the optimal sensor scan schedule.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.