Method of down-sampling data values
US7676099B2 · kind B2 · utility
1Cited by
4References
10Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 21, 2005 |
| Grant date | Mar 9, 2010 |
| Priority date | — |
| Expiry date | Jul 3, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T3/40
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The present invention relates to a method of down-sampling data values. A first set of data values comprise a central data value and peripheral values of original data spatially surrounding the central data value. The central and peripheral values are compared to determine whether any differences exceed a threshold. Whenever a difference does exceed a threshold, a clipped value based upon the central data value replaces the corresponding peripheral value, thereby producing a second set of data values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.