Method for characterizing a surface, and device therefor
US7678584B2 · kind B2 · utility
3Cited by
13References
11Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 3, 2006 |
| Grant date | Mar 16, 2010 |
| Priority date | — |
| Expiry date | Apr 10, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/552
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The present invention relates to a method of characterizing a surface and to a device for implementing this method. In particular, this method makes it possible to measure, qualitatively and/or quantitatively, interactions that may be physical, chemical, biochemical or biological.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.