Method and microscope for high spatial resolution examination of samples

US7679741B2 · kind B2 · utility

Assignee

• LEICA MICROSYSTEMS CMS GMBH · DE

Inventors

• Marcus Dyba · Wetzlar, DE
• Hilmar Gugel · Dossenheim, DE

Key dates

• Filing date: Jan 16, 2007
• Grant date: Mar 16, 2010
• Expiry date: Feb 25, 2028

Classification

• Technology area (CPC G): Physics
• CPC primary: G02B21/0076
• WIPO field: Optics
• WIPO sector: Instruments

Abstract

A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample (1) to be examined comprising a substance that can be repeatedly converted from a first state (Z1, A) into a second state (Z2, A), the first and the second states (Z1, A; Z2, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z1, A), and that the second state (Z2, B) is induced by means of an optical signal (4), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal (4) is provided in the form of a focal line (10) with a cross-sectional profile having at least one intensity zero point (5) with laterally neighboring intensity maxima (9).