Non-contact profile measurement system
US7679757B1 · kind B1 · utility
6Cited by
2References
32Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 31, 2003 |
| Grant date | Mar 16, 2010 |
| Priority date | — |
| Expiry date | Apr 6, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/245
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A non contact measurement system for in-process measurement of a work piece to is described. There is provided a sensor chassis that includes one or more contour sensors for capturing the profile of a work piece and outputting coordinate values describing one or more points representative of the profile of the work piece.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.