Parameterized test driven development
US7681180B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 6, 2007 |
| Grant date | Mar 16, 2010 |
| Priority date | — |
| Expiry date | Mar 18, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3688
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
In one embodiment a computer system automatically generates unit tests. The computer system accesses a parameterized unit test that provides a base outline from which one or more unit tests are automatically generated, generates input parameter values for a unit of software code, automatically generates a unit test configured to assess the functionality of the unit of software code, and receives test results from a software testing program and provides feedback to a user. In other embodiments, a computer system automatically maintains a unit test database. The computer system receives a unit test at a unit test database, assigns a test identity to the received unit test, determines that the test identity assigned to the received unit test is unique when compared to other unit tests, determines that the received unit test has different functionality coverage characteristics, and adds the received unit test to the unit test database.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.