Base and contour measuring system using the same
US7681323B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Dec 28, 2007 |
| Grant date | Mar 23, 2010 |
| Priority date | — |
| Expiry date | Aug 20, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B5/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An exemplary base includes a first elastic element, a second elastic, two first adjustable spacers and two second adjustable spacers. The first elastic element includes two first spaced plates and a first connecting element for connecting the two first spaced plates. The second elastic element includes two second spaced plates and a second connecting element for connecting the two second spaced plates. The first connecting element and the second connecting element are not in a plane. Two first adjustable spacers connect the two first spaced plates and adjust a distance between the two first spaced plates. Two second adjustable spacers connect the two second spaced plates and adjust a distance between the two second spaced plates.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.