Measurement instrument with synchronized interference signals
US7683650B1 · kind B1 · utility
4Cited by
9References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 24, 2007 |
| Grant date | Mar 23, 2010 |
| Priority date | — |
| Expiry date | Jul 23, 2027 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R23/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An instrument for measuring electrical parameters includes a measurement section having a measurement aperture; and a support section providing at least one of power and digital control for the measurement section. The support section has an interference signal frequency, wherein the interference frequency is an integer multiple of the reciprocal of the measurement aperture and the measurement aperture and the interference signal are phase-locked. As a result, the effect of the interference signal on electrical parameters measured is minimized.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.