Localization of a non-destructive testing probe
US7684282B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 22, 2006 |
| Grant date | Mar 23, 2010 |
| Priority date | — |
| Expiry date | Feb 22, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S5/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A standard non-destructive testing probe (4) may be coupled with a localization system (10) according to the invention so as to determine the position of the apparatus (4) on the surface to be analyzed (1) at any moment.The localization system (10) comprises an ultrasonic emitter (12) and two ultrasonic receivers (14, 16) coupled with means for determining the distance between the emitter (12) and the receivers (14, 16), each of the components being able to be moved freely relative to each other. The coupling between the emitter (12) and the probe (4) allows the position of the latter to be determined by triangulation.A localization and mapping method is also described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.