Patent · US Active

System and method for detecting software defects

US7685471B2 · kind B2 · utility

7Cited by

5References

16Claims

0Family size

Assignee

FUJITSU LIMITED · JP

Inventors

Sreeranga P. Rajan · Sunnyvale, US
Oksana Tkachuk · Palo Alto, US
Mukul R. Prasad · San Jose, US
Indradeep Ghosh · Cupertino, US

Key dates

Filing date	Feb 1, 2007
Grant date	Mar 23, 2010
Priority date	—
Expiry date	May 15, 2028

Classification

Technology area (CPC G)Physics
CPC primaryG06F9/44
WIPO fieldComputer technology
WIPO sectorElectrical engineering

Abstract

A method for detecting software defects includes selecting from a target program comprising a plurality of modules a first module for evaluation and isolating the first module. The method also includes iteratively performing the following steps until the first module has been reduced such that a validation program is able to determine whether the first module contains a defect: generating an environment surrounding the first module, the generated environment preserving at least one external constraint on the first module; reducing the size of the first module; and reducing the number of program states associated with the first module.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.