Patent · US Active

Method for probing a workpiece using a coordinate measuring machine and coordinate measuring machines

US7685726B2 · kind B2 · utility

10Cited by
20References
38Claims
0Family size

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Key dates

Filing dateJul 3, 2006
Grant dateMar 30, 2010
Priority date
Expiry dateMar 11, 2027

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B21/045
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

In probing by scanning a workpiece (71) to be measured using a coordinate measuring machine a stylus tip is moved before the scanning along a scanning path (73) along an initialization path (83) or/and after the scanning path (73) along a finalization path (85). A length (Lv, Ln) of the initialization path, respectively finalization path, is chosen in dependence of parameters of a concrete measuring task, in particular in dependence of a pre-determined scanning speed, a stiffness of the stylus or a mass of the stylus.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.