Patent · US Active

Nanoindenter

US7685869B2 · kind B2 · utility

6Cited by
57References
1Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 13, 2007
Grant dateMar 30, 2010
Priority date
Expiry dateMar 8, 2028

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2203/0078
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A new type of indenter is described. This device combines certain sensing and structural elements of atomic force microscopy with a module designed for the use of indentation probes, conventional diamond and otherwise, as well as unconventional designs, to produce high resolution and otherwise superior indentation measurements.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.