Patent · US Active

Integrated circuit test socket having elastic contact support and methods for use therewith

US7686621B2 · kind B2 · utility

0Cited by
3References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 12, 2008
Grant dateMar 30, 2010
Priority date—
Expiry dateApr 22, 2028

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/0466
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A socket can be used for testing an integrated circuit package having a plurality of rows of leads. The socket includes a base that is aligned with a circuit board having a plurality of contact pads. A plurality of rows of contact fingers are electrically coupled to the plurality of contact pads, each of the plurality of rows of contact fingers for engaging a corresponding one of the plurality of rows of leads in response to a retention force applied to the integrated circuit package. Each of the contact finger has a cantilevered end that is supported by a supporting force generated by an elastic contact in response to the retention force.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.