Variably dimensioned capacitance sensor elements
US7688080B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 17, 2006 |
| Grant date | Mar 30, 2010 |
| Priority date | — |
| Expiry date | Feb 23, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D5/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A capacitance sensing apparatus includes capacitance sensor elements covered by a layer of material. The layer of material has an uneven effect on a measure of capacitance induced in the capacitance sensor elements when an object is in proximity to a sensing surface. For example, the layer of material may have a non-uniform thickness, or a property of the material may be non-uniform across the layer. The capacitance sensor elements are dimensioned to compensate for the effect.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.