Method and apparatus for assessing sourced elements
US7688757B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 29, 2006 |
| Grant date | Mar 30, 2010 |
| Priority date | — |
| Expiry date | Jul 29, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F9/44536
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
The invention includes a method and apparatus for assessing an available version of a sourced element. The method includes obtaining a description of an available version of the sourced element, identifying a plurality of evaluation items for the sourced element by evaluating the description using at least one evaluation category including a plurality of evaluation parameters, and determining an overall assessment of the available version of the sourced element using the identified evaluation items for the sourced element. The overall assessment is indicative of a value associated with the available version of the sourced element. The method may further include generating overall assessments of other available versions of a sourced element or generating overall assessments of available versions of other sourced elements, and prioritizing the available versions of the sourced elements using the overall assessments of the available versions of the sourced elements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.