Element analysis device
US7688942B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Apr 15, 2005 |
| Grant date | Mar 30, 2010 |
| Priority date | — |
| Expiry date | Apr 9, 2026 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/076
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Described is an element analysis device, which can be used to obtain precise measurements even under unfavorable environmental conditions. For this, the device is provided with a transporting means with a measuring region (14) for transporting the substance (S) to be measured, an excitation source with an exit window located in a first case (22) and an X-ray fluorescence detector (30) that is directed toward the measuring region (14), as well as an entrance window (34) that is located in a second case (32). To minimize the air absorption and prevent dust and dirt from being deposited, a tube (40, 50) extends from the entrance window (34) and/or the exit window (24) in the direction of the measuring region, which tube is essentially tightly connected to the respective case (22, 32) and is open at the end facing the measuring region and is provided with a connection (44, 54) for feeding a flushing gas into the tube (FIG. 1).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.