Scanning system for three-dimensional objects
US7689032B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Nov 21, 2005 |
| Grant date | Mar 30, 2010 |
| Priority date | — |
| Expiry date | Dec 16, 2028 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S19/41
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A scanning system scans a surface of a three-dimensional object from a first position and a second position. Using common alignment at these positions, a first scanning sample and a second scanning sample are generated. The first and second scanning samples include point clouds having data points representing positions of the scanned surfaces. The first scanning sample and the second scanning sample are oriented relative to each other based on the common alignment of the scan positions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.