Patent · US Active

Method of producing a wafer scale package

US7692256B2 · kind B2 · utility

3Cited by
1References
37Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 23, 2007
Grant dateApr 6, 2010
Priority date
Expiry dateDec 25, 2027

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/0002
  • WIPO fieldAudio-visual technology
  • WIPO sectorElectrical engineering

Abstract

A method for manufacturing a wafer scale package including at least one substrate having replicated optical elements. The method uses two substrates, at least one of which is pre-shaped and has at least one recess in its front surface. Optical elements are replicated on a first substrate by causing a replication tool to abut the first substrate. The second substrate is then attached to the first substrate in an abutting relationship in such a way that the optical element is contained in a cavity formed by the recess in one of the substrates in combination with the other substrate. Thereby, a well defined axial distance between the optical elements and the second substrate is achieved. Consequently, a well defined axial distance between the optical elements and any other objects attached to the second substrate, e.g. further optical elements, image capturing devices, light sources, is also established.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.