Patent · US Expired

Semiconductor devices with improved heat dissipation and method for fabricating same

US7692289B2 · kind B2 · utility

1Cited by
16References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 12, 2002
Grant dateApr 6, 2010
Priority date
Expiry dateJul 1, 2024

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3011
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

The present invention is directed to improving the efficiency of removing heat from semiconductor devices. In addition, the method of manufacturing the improved devices has the potential of eliminating a key step in the traditional production process where the chips are highly susceptible to mechanical damage. A semiconductor element includes a semiconductor substrate having a heat removal side and a heat producing region, and at least one superstrate semiconductor layer defining the heat producing region. The heat removal side of the semiconductor substrate includes at least one recess region which extends closer to the heat-generating region than the remainder of the heat removal surface.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.